Test Forum

As AI-driven applications continue to reshape device complexity and performance requirements, the Test Forum will bring together industry leaders and experts to examine the future of semiconductor testing.  

To further strengthen collaboration across the test ecosystem, the forum will feature a networking reception, offering attendees an opportunity to connect informally over light refreshments ahead of the technical sessions. 

Following the reception, the forum will address a broad range of topics, including test strategy optimization, AI-driven ATE performance, system-level power delivery, design-aware data analysis, advanced measurement techniques, and the application of agentic AI in semiconductor testing. Together, these discussions will provide practical insights into how test technologies are evolving to support next-generation devices and AI-enabled systems. 

• Date: Feb 11(Wed), 2026
• Time: 12:00-17:10
• Room: 301, Conference Room (South), 3F, COEX
• Language: English and Korean (Simultaneous interpretation will NOT be provided.)
• Registration Fee (KRW)
  • Early Bird: SEMI Members 198,000 / Non-members 275,000 / Student 132,000
  • Onsite: 330,000

Committee

• James JinSoo Ko (Cohu)
• Hyuk Kwon (LUKEN Technologies)
• Yongkuk Kim (FormFactor)
• Jaehyun Kim (Samsung Electronics)
• JeongSeob Kim (Advantest Korea)
• Jong-ik Oh (Teradyne)
• Dongwoo Kim (Amkor Technology Korea)
• Yun Young Chang (SK hynix)
• Youngbae Choi (Unitest)