The Right Testing Strategy Can Save Designs

1:00 pm - 1:30 pm

Chiplet-based designs complicate testing and add new urgency to getting it done better and earlier.  Silicon providers must identify bad dies as soon as possible to keep costs and schedules under control.  Heterogeneous integration is a particularly expensive and time-consuming process, making the packaging step much more difficult and vital.  Test strategy and techniques are essential to getting good silicon at a reasonable price. 

Featured Speakers

Dave Collins

Dave Collins

RF Product & Business Unit Manager, Teradyne

Dave Collins is Teradyne’s RF Product manager. Responsible for Teradyne Semiconductor Test Division’s RF product roadmap and RF solutions. With more than 40 years of experience in the ATE industry, Dave Collins has a reputation for technical innovation and strategic vision.  

Prior to joining Teradyne, Dave held leadership positions at Qualcomm, LTX and Credence. Dave Collins holds a Bachelor of Science in Electrical Engineering from DeVry University and is a co-author of two patents.