Nimrod Shuall

Nimrod Shuall, MS EE and MBA from the Technion – Israel Institute of Technology, has over 20 years of experience in the semiconductor industry. He previously held a variety of applications, marketing, and customer-facing leadership roles at KLA, where he specialized in photolithography process control using optical and SEM-based measurement techniques. His expertise includes critical dimension (CD) and thin-film characterization through spectroscopic ellipsometry, as well as leading new product introductions (NPIs) of metrology tools to advanced technology nodes. 

Nimrod’s experience spans Logic, Memory, and Advanced Packaging segments. In 2025, he joined Thermo Fisher Scientific, where he currently leads the implementation of Wafer DualBeam FIB-SEM solutions for inline process control applications.