Fabian Schneider

Dr. Fabian Schneider is a semiconductor metrology professional with over six years of experience in semiconductor metrology and 15 years in optical systems. 

Mr. Schneider joined Nova Ltd. as part of the acquisition of Sentronics Metrology, which was completed in February 2025. In his current role, he manages the applications group of Nova's Sentronics line of products, responsible for addressing customers’ metrology needs and maximizing the value they gain from these advanced products. Prior to that, Mr. Schneider was a scientist in a group working on high-precision laser spectroscopy of short-lived heavy atoms. 

Dr. Fabian Schneider holds a M.Sc. in physics from TU Darmstadt, Germany, and continued his physics studies with a PhD at the University of Mainz, Germany.