Keiichiro Hitomi

Keiichiro Hitomi has been engaged in research on inline semiconductor metrology at Hitachi since 2005, with a primary focus on the research and development of CD-SEM. He currently serves as Manager of the Electron Beam Metrology Group. He received his B.S. degree in 2003 and M.S. degree in 2005 from Tohoku University, Japan.