Chris Kim

Chris Kim, Ph.D. has been a product management position at ASML since 2015 with responsibility of a metrology tool, YieldStar at Business Line Applications till 2020 and Overlay related products at Business Line EUV from 2021 to present. His current role in EUV is wafer alignment and overlay enhancement of EUV scanners.

Prior to joining ASML, Chris Kim was working for Samsung electronics in Foundry division for 6 years. During his 6 years at Samsung Foundry, Chris Kim spent time doing improving lithography performances in the area of overlay, imaging and productivity.

Kim received a Bachelor, Master and Ph.D. degree in Mechanical Engineering from Yonsei University, South Korea. His research during his Ph.D. was biomedical MEMS sensors and he had published papers at 14 SCI journals, 22 international conferences, 4 Korean journals and 23 Korean conferences.