Wookrae Kim

Wookrae Kim, Ph.D. has been tech leader position at Mechatronics Research, Samsung Electronics since 2020 with metrology & inspection Equipment R&D Team. Kim’s research has been focusing on R&D for next generation MI technique including high power deep UV light source system, hyper spectral imaging system for semiconductor inspection, multi angle ellipsometric metrology system, etc. from 2011 at Samsung.

Kim received a Ph.D degree in atomic & quantum optics from Seoul National University, Korea for capturing single atom with optical trap and measuring spectrum from the single trapped neutral atom using heterodyne based photon counting spectroscopy. Kim’s research area covers varieties of fields such as measuring the weakest signal from just one atom, measuring light field from kW-powered laser–matter interaction system, spectral scatterometry as well as microscopic imaging system, etc.