02-531-7800

Korean


Young-Sik Ghim

Ph.D./Principal Research Scientist/Head
Korea Research Institute of Standards and Science
Young-Sik Ghim has received his BS, MS, and PhD in mechanical engineering from Korea Advanced Institute of Science and Technology (KAIST). From 2009 to 2011, he worked at the Samsung Electro-Mechanics Company. He is currently working as a principal research scientist in Advanced Instrumentation Institute at Korea Research Institute of Standards and Science (KRISS). He also leads the space optics team since 2017. His research interest includes freeform surface metrology, multilayer thin-film metrology, and optical based micro-machining.
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