R. Joseph Kline


R. Joseph Kline leads the Dimensional Metrology for Nanomanufacturing project at NIST and researches X-ray based dimensional metrology of nanostructures for the semiconductor industry. He received his Ph.D. in Materials Science and Engineering at Stanford University in 2005. He has published more than 90 articles, 4 book chapters, and given more than 50 invited presentations. He received the 2012 Presidential Early Career Award for Science and Engineering.

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