그레고리 스미스

President, Semiconductor Test Division

GREG SMITH is the President of the Semiconductor Test Division at Teradyne.

Mr. Smith joined Teradyne in 2006 as a semiconductor test product manager. He has served in a variety of roles at Teradyne including Manager of the Complex SOC Business Unit, and Vice President of SOC Marketing in the Semiconductor Test Division.

Mr. Smith has over 30 years of engineering, management and marketing experience in semiconductor test.

Mr. Smith earned a Bachelor’s degree in Electrical Engineering from the University of Pennsylvania.


본 연사의 발표는 테스트포럼에서 볼 수 있습니다.

Share page with AddThis