Yudong Hao, Ph.D. is Director of Product Characterization at Nanometrics, Milpitas, CA, USA. He was the Director of Applications Development from 2014 to 216, in charge of applications solution R&D, and strategic account management. Dr. Hao joined Nanometrics in 2005. During his 12-year tenure at Nanometrics, Dr. Hao had contributed to multiple technology breakthroughs and advancements in Nanometrics’ flagship scatterometry product. As the leading scientist in OCD technology, he had supported all major semiconductor manufacturers in the world on all advanced technology nodes of Logic, DRAM and 3D NAND devices.
Dr. Hao received his Ph.D. degree in Optical Engineering in 2000 from Tsinghua University, Beijing, China. Prior to joining Nanometrics, Dr. Hao was a postdoctoral Sr. Fellow at University of Washington, Seattle, WA, USA.