Tuyen K. Tran, Ph.D. is an Intel Fellow and a Yield Manager with Intel’s Portland Technology Development (PTD) Division in Hillsboro, OR. Since joining PTD, Dr. Tran has worked on a variety of technical projects in the development of Defect Inspection/Imaging/Identification and Isolation technologies, and Yield Improvement. He is currently working on the research, development and integration of State of the art Inspection, Imaging, and elemental composition analysis capability and FI/FA techniques for the 10nm and below process technologies.
Tran received a BS/MS degree in Physics from Rensselaer Polytechnic Institute in Troy, NY, and a MSEE/PhD degree in Physics from the Georgia Institute of Technology in Atlanta, GA. He worked at IBM T.J. Watson Research Center in Yorktown Heights, NY before joining Intel in 1996.
You can hear his presentation at Mi Forum