02-531-7800

English


Test Forum​

Room 318, COEX Wednesday, January 31
1:00pm to 5:10pm

The 5G and Big Data, key issues in next connected world are increasing demand for putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining economical. To address these challenges, test industry is struggling with increasing instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware. In this Test Forum, you can get the clues to overcome these challenges from industry expertise.

 

  • Date: Jan 31(Wed), 2018
  • Time: 13:00-17:10
  • Room: #318, Conference Room (South), COEX
  • Language: English and Korean (Simultaneous interpretation will NOT be provided)​​

 

Committee

  • Young-Kwan Ko (UniTest)
  • James Jin-Soo Ko (Teradyne)
  • Kwonsung Ban (Samsung Electronics)
  • JeongBeom Bae (FormFactor Korea)
  • Sokyoung Song (SK hynix)
  • Kyu-hyuk Yeon (ASE Korea)
  • MinHo Chang (Amkor Technology Korea)
  • YH Jeon (TSE)
  • Jeongho Cho (Advantest Korea)

 

REGISTER

Registration Fee

  SEMI Member Non-Member Student
Early Bird (by Jan 24) 150,000 won 180,000 won 80,000 won
Onsite 180,000 won 200,000 won 100,000 won

 

Agenda

 13:00-13:40
   
 13:40-14:10
5-Gen, RF Testing Solution
Sungjong Park, Advantest
   
 14:10-14:40
   
 14:40-15:00 Break
   
 15:00-15:40
   
 15:40-16:10
   
 16:10-16:40
TBD
Ken Lanier, Teradyne
   
 16:40-17:10
 
*The agenda will be subject to change without notice.
* Presentation materials agreed by speaker will be distributed via e-mail after the events.
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