02-531-7800

English


Test Forum​

Room 318, COEX Thursday, January 24
1:00pm to 5:50pm

The 5G and Big Data, key issues in next connected world are increasing demand for putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining economical. To address these challenges, test industry is struggling with increasing instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware. In this Test Forum, you can get the clues to overcome these challenges from industry expertise.
 
  • Date: Jan 24(Thu), 2019
  • Time: 13:00-17:50
  • Room: #318, Conference Room (South), COEX
  • Language: English and Korean (Simultaneous interpretation will NOT be provided)​​

 

Committee

  • Young-Kwan Ko (UniTest)
  • James Jin-Soo Ko (Teradyne)
  • Kwonsung Ban (Samsung Electronics)
  • JeongBeom Bae (FormFactor Korea)
  • Sokyoung Song (SK hynix)
  • Kyu-hyuk Yeon (ASE Korea)
  • MinHo Chang (Amkor Technology Korea)
  • YH Jeon (TSE)
  • Jeongho Cho (Advantest Korea)

 

Registration Fee

  SEMI Member Non-Member Student
Early Bird (by Jan 16) 150,000 won 180,000 won 80,000 won
Onsite 180,000 won 200,000 won 100,000 won

 

Agenda

 
 
 13:00-13:30
TBD
 
Gregory Smith, Teradyne
 
 
13:30-14:10
Automotive
 
Brett Debenham, Micron
 
 
14:10-14:40
Automotive Semiconductor Testing
 
Jeonghwan Koo, Advantest
 
 
14:40-15:00
Break
 
 
15:00-15:30
TBD
 
SK hynix
 
 
15:30-16:00
Big Data
 
Ken Harris, PDF Solutions
 
 
16:00-16:30
TBD
 
Ken Lanier, Teradyne
 
 
16:30-16:50
Break
 
 
16:50-17:20
Cryogenic Probing Solution
 
Ralph Krippendorf, FormFactor
 
 
17:20-17:50
TBD
 
Hock Chang, Cohu
 
 

*The agenda will be subject to change without notice.

 
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